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AIEP Conference on fakes and forgeries |
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On occasion of the Salon du Timbre three members of the A.I.E.P., James VAN DER LINDEN, Jean-Francois BRUN and Madame Michele CHAUVET will held a conference in French on "Comment deceler les Faux" (How to detect fakes).
Vendredi (Friday) 15 June, 14.30 hrs (2.30 p.m.) at the Parc Floral de Paris, Entree Pyramide, Hall de Pinede, Salle des Conferences.
Every interested Philatelist is invited to come, the entrance is free!
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